Performance characteristics:

l   Integrated mini end window X-ray tube, large Si-PIN detector, high signal-to-noise ratio electronic component, and equivalent performance to desk-top X-ray Fluorescence Spectrometer

l   The sample chamber is in sealed round structure with good X-ray shielding capability.

l   Four groups of changeable filters; good results in full-element analysis and RoHS testing, different elements are measured corresponding their matrix materials.

l   PDA palm-top computer, wireless Bluetooth connection, light and convenient, with measurement data at hands

l   Packing case, solid and water-proof, contrives an integrated design with the instrument; suitable for harsh outdoors environment

l   Large-capacity Lithium Battery, and long hours of independent work, or AC to DC adapter for AC power supply

Technical specifications:

Measurable elements: K to U

Range of element content: 1ppm-99.99%

Measurable thinnest plating is 0.05um

Arbitrary optional analysis and identification models

Independent matrix effect correction models

Multi-variable non-linear regression procedure

Repeatability: 0.1％

Stability: 0.1％

Technical specifications

Measurable elements: K to U

Range of element content: 1ppm-99.99%

Measurable thinnest plating is 0.05um

Arbitrary optional analysis and identification models

Independent matrix effect correction models

Multi-variable non-linear regression procedure

Repeatability: 0.1％

Stability: 0.1％